The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2021

Filed:

Apr. 29, 2019
Applicant:

Houston Radar Llc, Houston, TX (US);

Inventors:

Sergei Sharonov, Houston, TX (US);

Brian Hill, Albuquerque, NM (US);

Vipin Malik, Cypress, TX (US);

Stanley J. Smith, Bradenton, FL (US);

Assignee:

Houston Radar LLC, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/92 (2006.01); G01S 13/64 (2006.01); G01S 13/87 (2006.01);
U.S. Cl.
CPC ...
G01S 13/92 (2013.01); G01S 13/64 (2013.01); G01S 13/87 (2013.01);
Abstract

A first method includes receiving a first reflected radar signal from a target in a first field of view and receiving a second reflected radar signal from a target in a second field of view offset from the first field of view by a predetermined distance; transforming the first and second reflected radar signals to obtain first and second sets of frequency coefficients, from which a frequency-dependent phase difference is obtained; and calculating a time-delay from the slope of the frequency dependence. A second method includes obtaining summed difference values between the first and second radar responses, where each of the summed difference values corresponds to different time shifts between the first and second radar response, and deriving from the summed difference values a time-delay associated with the target's motion from the first field of view to the second field of view. A third method combines the time-delays or associated speeds obtained from independent estimators.


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