The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2021

Filed:

Mar. 28, 2019
Applicants:

Northwestern University, Evanston, IL (US);

Southern Methodist University, Dallas, TX (US);

Inventors:

Oliver Strider Cossairt, Evanston, IL (US);

Fengqiang Li, Evanston, IL (US);

Florian Willomitzer, Evanston, IL (US);

Prasanna V. Rangarajan, Dallas, TX (US);

Assignees:

Northwestern University, Evanston, IL (US);

Southern Methodist University, Dallas, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01S 7/481 (2006.01); G01S 17/89 (2020.01); G01S 17/86 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4815 (2013.01); G01B 11/2441 (2013.01); G01S 17/86 (2020.01); G01S 17/89 (2013.01);
Abstract

A system configured to generate images includes one or more narrowband electromagnetic sources configured to emit a first radiation and a second radiation. The system also includes a detector configured to detect first reflected radiation off of an object and second reflected radiation off of the object, where the first reflected radiation results from the first radiation and the second reflected radiation results from the second radiation. The system further includes a processor operatively coupled to the detector and configured to generate an image of the object based at least in part on a first amplitude of the first reflected radiation and a second amplitude of the second reflected radiation. The processor is also configured to determine a depth profile of the object based at least in part on the first reflected radiation and the second reflected radiation detected by the detector.


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