The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2021

Filed:

Dec. 02, 2019
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Andreas Lagler, Munich, DE;

Florian Ramian, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/3177 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31705 (2013.01);
Abstract

A method for at least one of identifying and compensating for system errors in a measurement system is disclosed, wherein the measurement system comprises a signal generator and a signal analyzer. The method comprises: generating a test signal via the signal generator, the test signal having predetermined properties; forwarding the test signal to a device under test; processing the test signal via the device under test, thereby generating a transmission signal; receiving the transmission signal via the signal analyzer; determining a response function of the device under test based on the test signal and based on the transmission signal; and determining at least one periodic component of the response function. Further, a measurement system as well as a calibration system are disclosed.


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