The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2021
Filed:
Feb. 22, 2018
Fujifilm Corporation, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An inspection specifying unit specifies a member position that is a point and a type of damage that is a soundness determination target on the basis of building structure information. An inspection data analysis unit acquires the image data from an inspection data acquisition unit, analyzes the image data, and determines from the image data, whether or not there is damage of the type of damage specified as the inspection target, and the degree of damage in a case where there is the damage. A damage influence degree calculation unit calculates the degree of damage influence for each damage. A soundness determination unit determines the soundness of the entire building on the basis of the degree of damage influence for each damage. A soundness output unit outputs the soundness determined in to a display, a printer, or the like.