The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2021
Filed:
Feb. 15, 2018
Hrl Laboratories, Llc, Malibu, CA (US);
Adour V. Kabakian, Monterey Park, CA (US);
Shuoqin Wang, Oak Park, CA (US);
Logan D. Sorenson, Thousand Oaks, CA (US);
Hung Nguyen, Los Angeles, CA (US);
Raviv Perahia, Agoura Hills, CA (US);
HRL Laboratories, LLC, Malibu, CA (US);
Abstract
Described is a system for adaptive calibration of a sensor of an inertial measurement unit. Following each sensor measurement, the system performs automatic calibration of a multi-axis sensor. A reliability of a current calibration is assessed. If the current calibration is reliable, then bias and scale factor values are updated according to the most recent sensor measurement, resulting in updated bias and scale factor values. If the current calibration is not reliable, then previous bias and scale factor values are used. The system causes automatic calibration of the multi-axis sensor using either the updated or previous bias and scale factor values.