The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2021
Filed:
Jul. 30, 2018
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Kentaro Tsukamoto, Azumino, JP;
Tomoki Harada, Azumino, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G01B 11/25 (2006.01); B25J 19/02 (2006.01); G06T 7/521 (2017.01); G06T 7/55 (2017.01); B25J 13/08 (2006.01); B25J 9/16 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G01B 11/254 (2013.01); B25J 9/1697 (2013.01); B25J 13/08 (2013.01); B25J 19/021 (2013.01); G01B 11/2527 (2013.01); G06T 7/521 (2017.01); G06T 7/55 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/30164 (2013.01); H04N 5/23299 (2018.08);
Abstract
A three-dimensional shape measurement device includes a controller, in which the controller starts a process in which a plurality of different phase pattern images is projected by a projector, whenever the phase pattern image is projected by the projector before a rising time elapses, the rising time being a time until the luminance of light does not temporally change after a light source of the projector applies the light, and measures a three-dimensional shape of a target object onto which the phase pattern image is projected on the basis of a captured image obtained by the camera after the process is performed.