The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2021
Filed:
Jan. 15, 2020
Fanuc Corporation, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
The present disclosure is intended to provide an automatic three-dimensional measurement-based inspection system for workpieces which enables three-dimensional measurement-based inspection to be performed more efficiently. An automatic three-dimensional measurement-based inspection system for workpieces includes: an automated warehouse having a measurement target repository for storing a workpiece to undergo measurement-based inspection performed by a three-dimensional measurement apparatus, and having a measurement-purpose repository for storing the workpiece conveyed from the measurement target repository by a stacker crane when the three-dimensional measurement apparatus is going to perform the measurement; and the three-dimensional measurement apparatus provided is a three-dimensional measurement region that is adjacent to the measurement-purpose repository.