The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2021
Filed:
Dec. 28, 2017
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Stephen J. Heisig, Tarrytown, NY (US);
Katsuyuki Sakuma, Fishkill, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G01B 7/16 (2006.01); A61B 5/107 (2006.01); A61B 5/11 (2006.01);
U.S. Cl.
CPC ...
A61B 5/6826 (2013.01); A61B 5/1077 (2013.01); A61B 5/1125 (2013.01); A61B 5/4082 (2013.01); A61B 5/449 (2013.01); A61B 5/4842 (2013.01); G01B 7/18 (2013.01); G01B 7/20 (2013.01); A61B 2503/40 (2013.01); A61B 2562/0261 (2013.01);
Abstract
A method includes measuring, using at least one sensor, strain on a nail plate of a subject, wherein the at least one sensor outputs a data stream corresponding to the measuring, communicating the data stream to a receiver, and interpreting, by the receiver, the data stream to determine a parameter of interest of the subject.