The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2021
Filed:
May. 08, 2018
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventor:
Yoshiro Imai, Kanagawa, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 1/04 (2006.01); A61B 1/06 (2006.01); A61B 1/045 (2006.01); G02B 23/24 (2006.01);
U.S. Cl.
CPC ...
A61B 1/00009 (2013.01); A61B 1/0005 (2013.01); A61B 1/043 (2013.01); A61B 1/045 (2013.01); A61B 1/06 (2013.01); A61B 1/0638 (2013.01); G02B 23/2484 (2013.01);
Abstract
The endoscope system includes an image acquiring unit that acquires a first image and a second image, the first image being obtained by imaging an observation target by using first illumination light, the second image being obtained by imaging the observation target by using second illumination light that is different from the first illumination light at a different timing from the first image; an alignment unit that aligns the first image and the second image; and an accuracy changing unit that changes an accuracy of the alignment in accordance with at least a structure of interest to which an attention is paid in the observation target.