The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2021

Filed:

Sep. 06, 2018
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Yuncheng Zhu, Tokyo, JP;

Yoshiteru Takeshima, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04L 12/26 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
H04L 41/145 (2013.01); H04L 41/082 (2013.01); H04L 41/0803 (2013.01); H04L 41/142 (2013.01); H04L 43/062 (2013.01); H04L 41/16 (2013.01); H04L 67/12 (2013.01);
Abstract

A data analysis device executes: acquiring time-series data including data of multiple items from an analysis target system; extracting data of at least, one first item from the time series data; calculating a feature of a temporal change of the data of the first item; extracting data of at least one second item from the time series data; calculating a feature of at least one of a relevance between the data of the first item and the data of the second item and a relevance between the data of the multiple second items; determining a model corresponding to the analysis target system on the basis of the feature of the temporal change and the change of the relevance; and setting the parameter in the analysis target system by using the parameter setting configuration of the model.


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