The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Jan. 02, 2020
Huawei Technologies Co., Ltd., Guangdong, CN;
Yan Zeng, Hangzhou, CN;
Fan Yu, Hangzhou, CN;
Yinwen Wang, Hangzhou, CN;
Yutao Shuai, Hangzhou, CN;
Xiaoming Yue, Hangzhou, CN;
HUAWEI TECHNOLOGIES CO., LTD., Shenzhen, CN;
Abstract
Embodiments of this application relate to an intra-cluster node troubleshooting method and device. The method includes: obtaining fault detection topology information of a cluster, where the fault detection topology information includes a fault detection relationship between all nodes in the cluster; obtaining a fault indication message, where the fault indication message is used to indicate unreachability from a detection node to a detected node; determining a sub-cluster of the cluster based on the fault detection topology information and the fault indication message, where nodes that belong to different sub-clusters are unreachable to each other; and determining a working cluster based on the sub-cluster of the cluster. According to the embodiments of this application, available nodes in the cluster can be retained to a maximum extent at relatively low costs. In this way, a quantity of available nodes in the cluster is increased, high availability is ensured.