The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Oct. 28, 2019
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04B 17/15 (2015.01); H04B 17/29 (2015.01);
U.S. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 17/29 (2015.01);
Abstract
A method is provided. The method includes determining, in a determination by an electronic testing device, one or more locations in a cellular network where a test case is to be executed, a time at which the test case is to be executed at the one or more locations, a number of times the test case is to be executed at the one or more locations, or a type of a test equipment on which the test case is to be executed. A test context for testing a user equipment is determined based on a result of the determination. An optimal test case is determined from a test case repository, based on the test context, and the optimal test case is executed.