The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
May. 06, 2016
Applicant:
Northwestern University, Evanston, IL (US);
Inventor:
Jie Gu, Evanston, IL (US);
Assignee:
NORTHWESTERN UNIVERSITY, Evanston, IL (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/26 (2006.01); H03K 3/03 (2006.01); H03K 5/24 (2006.01); H03K 19/0175 (2006.01); H03K 3/356 (2006.01);
U.S. Cl.
CPC ...
H03K 19/017509 (2013.01); G06F 1/26 (2013.01); H03K 3/0315 (2013.01); H03K 3/35613 (2013.01); H03K 3/356165 (2013.01); H03K 5/24 (2013.01);
Abstract
An accelerated aging circuit is described to shorten the required stress time to a few seconds of operation. Due to the challenges posed by process variation in advanced CMOS technology, a stochastic processing methodology is also described to reduce the failure rate of the tracking and detection. Combining both circuit and system level acceleration, the creation of a silicon marker can be realized within seconds of usage in contrast with days of operation from previously reported aging monitor.