The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Nov. 19, 2019
Electronics and Telecommunications Research Institute, Daejeon, KR;
Min Gi Jeong, Daejeon, KR;
Jeong Kyun Kim, Daejeon, KR;
Myung Nam Bae, Daejeon, KR;
Kang Bok Lee, Daejeon, KR;
Sang Yeoun Lee, Daejeon, KR;
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Abstract
A walking analysis method includes measuring impacts due to floor landing occurring during walking; identifying an impact section before floor landing, a free fall section, and an impact peak section by floor landing in an impact graph over time; analyzing at least one impact-related parameter for the impact section before floor landing, the free fall section, and the impact peak section by floor landing; and determining a walking-related accident type according to a result of analyzing the at least one impact-related parameter. Accordingly, by classifying and detecting a variety of accidents that may actually occur, the main walking characteristics that are dangerous in the actual accident can be extracted.