The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Jan. 16, 2020
Walmart Apollo, Llc, Bentonville, AR (US);
Mangesh N. Kulkarni Wadhonkar, Hyderabad, IN;
Parul Aggarwal, Samrala, IN;
Anika Setia, Bangalore, IN;
Akshay Jindal, Udaipur, IN;
Rahul Kumar, Bangalore, IN;
Amit Jhunjhunwala, Bangalore, IN;
Artur A. Grochala, Dallas, TX (US);
Walmart Apollo, LLC, Bentonville, AR (US);
Abstract
In some embodiments, apparatuses and methods are provided herein useful to assess quality of produce at a facility. In some embodiments, there is provided a system for assessing quality of produce at a facility including a produce assessment station configured to provide a staging area to determine a quality classification of a target produce. By one approach, the produce assessment station includes a fixed surface; a rotatable base, a first arm comprising a microphone; a second arm comprising a tapping device; and a local control circuit. In one configuration, the local control circuit configured to rotate the rotatable base at a particular angle and at a particular time interval and receive audio data from the microphone. By one approach, the system includes a plurality of sensors and a portable device configured to provide a signal to the local control circuit to initiate the quality classification of the target produce.