The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Jan. 12, 2017
Eos Gmbh Electro Optical Systems, Krailling, DE;
Juha Kotila, Turku, FI;
EOS GmbH Electro Optical Systems, Krailling, DE;
Abstract
A method of training a detection system is able to acquire volume image data in an additively manufactured object for the detection of process irregularities, and comprises the steps of: a) receiving process irregularity data referring to a selected location within an additively manufactured reference object in which selected location a predefined process irregularity occurred during the additive manufacture of the object, b) acquiring volume image data of a volume of the reference object comprising at least the selected location by said detection system, c) identifying within the volume image data characteristic data which represent a difference between the volume image data of the selected location in comparison with the volume image data of at least one other location of the reference object and/or of a number of other additively manufactured objects in which no process irregularity has occurred and/or no process irregularity is suspected, d) assigning to the predefined process irregularity the characteristic data as a representative of the predefined process irregularity.