The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
May. 18, 2020
General Electric Company, Schenectady, NY (US);
Ritwick Jana, Bangalore, IN;
Bryan David Maule, Skaneateles Falls, NY (US);
Michael Christopher Domke, Skaneateles Falls, NY (US);
Thomas D. Britton, Skaneateles Falls, NY (US);
Robert Scott Lockhart, Skaneateles Falls, NY (US);
Baker Hughes, a GE Company, LLC, Houston, TX (US);
Abstract
A non-destructive testing (NDT) system can provide a tree model of an inspection on a display of an NDT device and on a web page configured in a web browser on a computing device coupled to the NDT device. Inspection data acquired using the NDT device can be provided in real-time as the inspection data is associated with a node configured in the tree model. The NDT system can generate an inspection tree model based on an inspection template including a template tree model. Defect properties, inspection instructions, and/or image transforms can be applied to nodes of the template tree model such that the generated inspection tree model includes the applied defect properties, inspection instructions, and/or image transforms, which can then be applied to the inspection data acquired at the inspection point location corresponding to each node.