The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Jan. 30, 2019
Emc Ip Holding Company Llc, Hopkinton, MA (US);
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Techniques are provided for generating adaptive policies from organization data for detection of risk-related events. One method comprises obtaining features identified in organization data of an organization for a risk analysis, wherein a given feature comprises a plurality of data values, wherein each data value for the given feature comprises a discrete value of the given feature or a range of values for the given feature; obtaining a probability of occurrence associated with each data value based on the organization data; identifying a plurality of candidate anomalous data values based on the probabilities of occurrence; determining an intervention rate for a plurality of combinations of the candidate anomalous data values; and generating policies for the organization using the combinations of candidate anomalous data values based on a corresponding intervention rate. The generated policies are used to detect one or more risk-related events.