The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2021

Filed:

Feb. 08, 2019
Applicant:

Datalogic Ip Tech S.r.l., Calderara di Reno, IT;

Inventors:

Alessandro Franchi, Bologna, IT;

Leonardo Mora, Mogliano, IT;

Assignee:

Datalogic IP Tech S.R.L., Calderara di Reno, IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06K 9/48 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00536 (2013.01); G06K 9/00523 (2013.01); G06K 9/48 (2013.01); G06K 9/6204 (2013.01); G06K 2209/03 (2013.01); G06K 2209/19 (2013.01); G06K 2209/25 (2013.01);
Abstract

A system and method for matching a pattern may include generating a set of model descriptors representative of segment features of a first imaged object. A set of query descriptors representative of segment features of a second imaged object may be generated. A first model segment may be selected to align with the query segments to determine if any of the query segments correspond with the first model segment based on respective model descriptors and query descriptors. An hypothesis may be generated by computing a transformation to match the selected first model descriptor with a query descriptor. The hypothesis may be validated by a model fitting algorithm when comparing other transformed model descriptors with other query descriptors. Based on a consensus value from the model fitting algorithm, a determination as to whether a pattern match exists between the first and second images may be made.


Find Patent Forward Citations

Loading…