The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2021

Filed:

Dec. 30, 2019
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Ding-Zheng Lin, Taipei, TW;

Yu-Ling Hsu, Taipei, TW;

Ping-Chen Chen, Zhubei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/28 (2006.01); G06K 9/00 (2006.01); G06K 9/20 (2006.01); G06F 21/32 (2013.01); G02B 3/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0004 (2013.01); G02B 3/0006 (2013.01); G06F 21/32 (2013.01); G06K 9/209 (2013.01);
Abstract

An image module includes a photosensitive element and a light-screening structure disposed on the photosensitive element. The light-screening structure includes a light-transmitting layer. The light-screening structure also includes a first light-shielding layer disposed in the light-transmitting layer and having a first light passage portion. The light-screening structure further includes a second light-shielding layer disposed between the first light-shielding layer and the photosensitive element and having a second light passage portion. The light-screening structure includes a condensing structure disposed on the light-transmitting layer. The first light passage portion and the second light passage portion correspond to the photosensitive element. Light passing through the condensing structure produces a concentrated beam, and the apertures of the first light passage portion and the second light passage portion are respectively adjusted according to the widths of the concentrated beam at the first light-shielding layer and at the second light-shielding layer.


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