The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Dec. 03, 2019
Shanghai Harvest Intelligence Technology Co., Ltd., Shanghai, CN;
Xueke Hu, Shanghai, CN;
Tianyang Wang, Shanghai, CN;
Fei Wang, Shanghai, CN;
Sheng Feng, Shanghai, CN;
Fengjun Gu, Shanghai, CN;
Jiandong Huang, Shanghai, CN;
Shanghai Harvest Intelligence Technology Co., Ltd., Shanghai, CN;
Abstract
A method for determining an imaging ratio of a curved panel is provided, wherein a first surface of the curved panel is placed with a to-be-imaged object thereon, an image capturing device is disposed on a second surface opposite to the first surface in a thickness direction of the curved panel, the image capturing device is configured to capture an image of the to-be-imaged object being imaged by the curved panel, and the method comprises: obtaining a thickness of the curved panel and a curvature radius of the first surface of the curved panel; and calculating the imaging ratio of the curved panel for the to-be-imaged object according to the obtained thickness and curvature radius. Therefore, the captured image is corrected according to the imaging ratio, thereby capturing an image that is close to an actual size of the to-be-imaged object.