The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Mar. 14, 2019
Wuhan University of Technology, Wuhan, CN;
Jinli Xu, Wuhan, CN;
Xiaolei Liu, Wuhan, CN;
Fengyun Huang, Wuhan, CN;
Chunxiao Chen, Wuhan, CN;
Qiangqiang Niu, Wuhan, CN;
Bing Jia, Wuhan, CN;
Qian Yu, Wuhan, CN;
Weiteng Liu, Wuhan, CN;
Mingya Du, Wuhan, CN;
Qinggu Pan, Wuhan, CN;
Shijun Luo, Wuhan, CN;
Delong Hu, Wuhan, CN;
Fancong Zeng, Wuhan, CN;
Wei Xu, Wuhan, CN;
Jiwei Zhu, Wuhan, CN;
Other;
Abstract
The present invention is related to computer-assisted process design, and an MBD-based three-dimensional process designing method and platform for a typical automobile machined part are disclosed. By taking three-dimensional CAD software as a carrier, an MBD design model, and a process MBD model as a data output, the design flow comprises steps such as establishment of MBD-related standards, creation of an MBD design model, feature classification and creation of a feature library, feature recognition and information extraction, generation of manufacturing elements, clustering of the manufacturing elements and generation of procedures, sequencing of the procedures, and creation of manufacturing features body and procedure models. According to the present invention, the process MBD model integrating procedure models and manufacturing feature bodies can be rapidly generated, visualization of the process design flow can be realized, and the process design efficiency can be improved, thereby laying a foundation for the integration of CAD/CAPP/CAM.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile