The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Aug. 21, 2019
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Mallik Bulusu, Bellevue, WA (US);
Tom L. Nguyen, Auburn, WA (US);
Neeraj Ladkani, Bothell, WA (US);
Ravi Mysore Shantamurthy, Bothell, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Combined operational steps and device characteristics help preserve data against integrity threats. Data is divided into critical data and non-critical data, based on criteria such as customer requirements, workload criticality, or virtual machine criticality. Data may be generated in a compute node for storage in a storage node, for example. Critical data is stored in a battery-backed memory aperture at physical addresses where it will be flushed ahead of the non-critical data due to a flush order imposed by or on the battery-backed memory, e.g., a bottom-up NVDIMM flush order. Redundant copies of the data (especially non-critical data) may also be kept in case it does not get flushed in time. Battery-backed memory apertures are sized and located according to their battery's characteristics, and may be relocated or resized as conditions change. Flush defragging is performed to optimize use of the aperture, especially within the portion that holds critical data.