The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2021

Filed:

Nov. 10, 2017
Applicant:

Google Llc, Mountain View, CA (US);

Inventors:

Ravi Shah, Boulder, CO (US);

Maya Ben Ari, Mountain View, CA (US);

Keun Soo Yim, San Jose, CA (US);

Assignee:

Google LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/46 (2006.01); G06F 11/30 (2006.01); G06F 11/263 (2006.01); G06F 11/28 (2006.01); G06F 11/36 (2006.01); G06F 9/54 (2006.01); G06F 11/273 (2006.01); G06F 9/455 (2018.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 9/547 (2013.01); G06F 11/3688 (2013.01); G06F 9/45558 (2013.01); G06F 11/2294 (2013.01); G06F 11/263 (2013.01); G06F 11/273 (2013.01); G06F 11/3672 (2013.01);
Abstract

Methods and apparatus are provided for testing computing devices. A host computing device is provided for testing devices under test (DUTs) using a test suite that includes first and second tests. The DUTs can include a first group of DUTs with a first DUT and a second group of DUTs with a second DUT. The first and second groups of DUTs can share a common design. The host computing device can determine that the DUTs execute the first test before the second test. The host computing device can receive failing first test results for the first DUT. The host computing device can determine, based on the first test results and that the first and second DUT groups share a common design, to execute the second test before the first test and can subsequently instruct the second DUT to execute the second test before the first test.


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