The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Dec. 15, 2020
International Business Machines Corporation, Armonk, NY (US);
Andrew C. M. Hicks, Highland, NY (US);
Daniel Nicolas Gisolfi, Hopewell Junction, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Inputs to a system under test (SUT) are modeled as a collection of attribute-value pairs. A set of testcases is executed using a set of test vectors that provides complete n-wise coverage of the attribute-value pairs. For each execution of the testcases, updating, for each execution of the set of testcases, for each testcase, a non-binary success rate (S) based on the binary execution results. In response to a first success rate corresponding to a particular testcase being below a predetermined threshold, a second set of testcases is generated based on the test vectors. For each testcase, a second success rate (S') is computed based on a second set of execution results of a second set of testcases. In response to the second success rate corresponding to the particular testcase being substantially same as the first success rate, a user is notified of a defect in modeling the SUT inputs.