The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Jun. 11, 2019
Applicant:
Anritsu Company, Morgan Hill, CA (US);
Inventor:
Jon S Martens, San Jose, CA (US);
Assignee:
ANRITSU COMPANY, Morgan Hill, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G06F 17/13 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2646 (2013.01); G01R 31/2841 (2013.01); G06F 17/13 (2013.01);
Abstract
A system for measuring noise characteristics of a device under test (DUT) includes one or more computers and memory, a first receiver connected to a first port of the DUT, a second receiver connected to a second port of the DUT, the second receiver being synchronized with the first receiver and a non-transitory computer readable storage medium having instructions thereon that when read and executed by the one or more computers causes the system to transmit signals to the DUT, receive signals from the DUT, and characterize noise associated with the DUT within the received signals.