The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Mar. 21, 2019
Analog Devices International Unlimited Company, Limerick, IE;
David J. Clarke, Patrickswell, IE;
Stephen Denis Heffernan, Co. Tipperary, IE;
Nijun Wei, Lianyungang, CN;
Alan J. O'Donnell, Castletroy, IE;
Patrick Martin McGuinness, Pallaskenry, IE;
Shaun Bradley, Patrickswell, IE;
Edward John Coyne, Athenry, IE;
David Aherne, Limerick, IE;
David M. Boland, Limerick, IE;
Analog Devices International Unlimited Company, Limerick, IE;
Abstract
The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event. The two conductive structures have facing surfaces that have different shapes.