The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Jan. 28, 2019
Applicant:
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Inventors:
Achim Sinz, Waiblingen, DE;
Tobias Huber, Backnang, DE;
Assignee:
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); G01N 35/00 (2006.01); G01N 35/04 (2006.01); B01L 3/00 (2006.01); G01D 5/14 (2006.01); B65G 54/02 (2006.01); B01L 9/06 (2006.01);
U.S. Cl.
CPC ...
G01N 35/10 (2013.01); B01L 3/502715 (2013.01); G01N 35/00732 (2013.01); G01N 35/04 (2013.01); B01L 9/06 (2013.01); B01L 2200/18 (2013.01); B01L 2300/0627 (2013.01); B65G 54/02 (2013.01); B65G 2201/0261 (2013.01); G01D 5/142 (2013.01); G01N 2035/00752 (2013.01); G01N 2035/00772 (2013.01); G01N 2035/0406 (2013.01); G01N 2035/0477 (2013.01); G01N 2035/0491 (2013.01); G01N 2035/1048 (2013.01);
Abstract
A laboratory sample distribution system is presented. The laboratory sample distribution system comprises an optical inspection device adapted to optically inspect items that need to be optically inspected, at least one mirror device, a driver adapted to move the items to be optically inspected and to move the at least one mirror device, and a control device configured to move an item to be optically inspected relative to the optical inspection device by controlling the driver such that a field of view of the optical inspection device is extended.