The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2021

Filed:

May. 17, 2019
Applicant:

Mitsubishi Power, Ltd., Yokohama, JP;

Inventor:

Yutaka Suzuki, Tokyo, JP;

Assignee:

Mitsubishi Power, Ltd., Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/26 (2006.01); G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
G01N 29/262 (2013.01); G01N 29/043 (2013.01);
Abstract

A sensorincluding a plurality of elementsis divided into a plurality of regionsand. A UT deviceis connected to each region of the sensorvia a switch. At least one region of the sensorused for UT is selected for each flaw detection point according to a positional relation of the flaw detection point to the sensor. The UT device is connected to the selected at least one region of the sensorby the switch. For a flaw detection point for which one region is selected, UT is performed by using the selected one region. For a flaw detection point for which a plurality of regions are selected, a necessary number of times of ultrasonic testing are performed according to a number of the regions by using the selected plurality of regions, and the results are subjected to addition processing.


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