The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Sep. 17, 2017
Soreq Nuclear Research Center, Yavne, IL;
Security Matters Ltd., D. N. Hevel Eilot, IL;
Yair Grof, Rehovot, IL;
Tzemah Kislev, Mazkeret Bathya, IL;
Nadav Yoran, Tel Aviv, IL;
Haggai Alon, Kibbutz Naan, IL;
Mor Kaplinsky, Herzliya, IL;
SOREQ NUCLEAR RESEARCH CENTER, Yavne, IL;
SECURITY MATTERS LTD., D. N. Hevel Eilot, IL;
Abstract
A control system and method are presented for controlling operation of an X-ray Fluorescent (XRF) system for detecting at least one material carried by a sample, for example at least one marker carried by the sample. The control system comprises: data input utility for receiving input data comprising material/marker related data about said at least one material/marker; and data processor and analyzer utility. The data processor and analyzer utility is configured and operable for analyzing the input data and determining optimal geometrical characteristics of the XRF system for optimizing operational conditions of said XRF system to maximize amount of primary X-ray radiation that reaches a predetermined region of the sample and is absorbed by a volume of said region and to maximize a portion of secondary radiation emitted from said region that reaches a detector of the XRF system; and for generating operational data to the XRF system enabling adjustment of the geometrical characteristics of the XRF system.