The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2021

Filed:

Mar. 16, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Woo Chang Lee, Anyang-si, KR;

Yun S Park, Suwon-si, KR;

Ho Jun Chang, Seoul, KR;

Sung Hyun Nam, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); G01N 21/03 (2006.01); G01J 3/44 (2006.01); G01N 15/02 (2006.01); G01N 15/00 (2006.01); G01N 15/06 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01);
Abstract

Provided is an apparatus for measuring particulate matter including an image obtaining device configured to charge particulate matter particles included in air that is introduced to the image obtaining device, and to obtain an image of the charged particulate matter particles based on lens-free imaging, a spectrum obtaining device configured to obtain a Raman spectrum of the charged particulate matter particles, and a processor configured to determine a size of the particulate matter particles and a concentration of the particulate matter particles based on the obtained image, and to determine components of the particulate matter particles based on the obtained Raman spectrum.


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