The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Mar. 07, 2017
Applicant:
Sony Corporation, Tokyo, JP;
Inventors:
Yoshitsugu Sakai, Kanagawa, JP;
Masaaki Abe, Kanagawa, JP;
Koichi Tsukihara, Kanagawa, JP;
Shoji Akiyama, Kanagawa, JP;
Shinichi Hasegawa, Chiba, JP;
Assignee:
SONY CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01);
Abstract
Provided is a microparticle measurement device including a light emission unit that emits light to a microparticle to be analyzed and a light detection unit that detects light generated from the microparticle at a predetermined detection position. The microparticle measurement device further includes an analysis unit that is connected to the light detection unit and analyzes a detection value of the light detected by the light detection unit. The light detection unit is movable from the detection position.