The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Sep. 22, 2017
Malvern Panalytical Limited, Malvern, GB;
Jason Corbett, Malvern, GB;
Richard Scullion, Malvern, GB;
Malvern Panalytical Limited, Malvern, GB;
Abstract
A particle characterisation instrument, comprising a light source, a sample cell, an optical element between the light source and sample cell and a detector. The optical element is configured to modify light from the light source to create a modified beam, the modified beam: a) interfering with itself to create an effective beam in the sample cell along an illumination axis and b) diverging in the far field to produce a dark region along the illumination axis that is substantially not illuminated at a distance from the sample cell. The detector is at the distance from the sample cell, and is configured to detect light scattered from the effective beam by a sample in the sample cell, the detector positioned to detect forward or back scattered light along a scattering axis that is at an angle of 0° to 10° from the illumination axis.