The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
May. 26, 2016
Applicant:
Quality Vision International Inc., Rochester, NY (US);
Inventors:
Edward Tarry Polidor, Webster, NY (US);
Jeffrey Blood, Victor, NY (US);
Daniel C. Abbas, Webster, NY (US);
Assignee:
QUALITY VISION INTERNATIONAL INC., Rochester, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G01B 5/008 (2006.01); G01B 11/06 (2006.01); G01B 5/06 (2006.01); G01B 11/245 (2006.01);
U.S. Cl.
CPC ...
G01B 11/25 (2013.01); G01B 5/008 (2013.01); G01B 5/066 (2013.01); G01B 11/0616 (2013.01); G01B 11/245 (2013.01);
Abstract
Method and apparatus for scanning surfaces of a three-dimensional object employ a first sensor to acquire first data points and a second sensor to acquire second data points. The first sensor has a relatively lower accuracy and faster data point acquisition rate than the second sensor, and the second data points are assigned a higher weighting than the first data points. A three-dimensional coordinate point cloud is generated based on the both the first and second data points and their respective weighting.