The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Jan. 22, 2017
Posco, Pohang-si, KR;
Postech Academy-industry Foundation, Pohang-si, KR;
Joon Won Park, Seoul, KR;
Joung Hun Kim, Seoul, KR;
Young Kyu Kim, Yeosu-si, KR;
Hyun Seo Koo, Seoul, KR;
Yoon Hee Lee, Seoul, KR;
POSCO, Pohang-si, KR;
POSTECH ACADEMY-INDUSTRY FOUNDATION, Pohang-si, KR;
Abstract
The present invention provides an apparatus and a method for detecting the presence of and/or determining the amount of a label-free microRNA using an atomic force microscope. The method is extremely selective and/or ultrasensitive. In particular, the present invention provides a cantilever comprising a probe that selectively binds to a double strand of DNA/RNA hybrid complex. The probe comprises a hybrid binding domain (HBD) or a variant thereof.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile