The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2021

Filed:

Feb. 23, 2016
Applicant:

Mitsubishi Heavy Industries Machinery Systems, Ltd., Hyogo, JP;

Inventors:

Hideki Mizutani, Hiroshima, JP;

Akira Ogino, Hiroshima, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B31F 1/24 (2006.01); B31F 1/28 (2006.01); B31F 5/04 (2006.01); B31F 7/00 (2006.01);
U.S. Cl.
CPC ...
B31F 1/24 (2013.01); B31F 1/284 (2013.01); B31F 5/04 (2013.01); B31F 7/00 (2013.01); B31F 2201/0784 (2013.01);
Abstract

A warp determination device for a corrugated cardboard sheet manufacturing device is provided with: displacement value measurement method for measuring displacement values of a plurality of corrugated cardboard sheet pieces on the downstream side of a slitter scorer and on the upstream side of a sheet stacking unit; and warp status determination means for dividing a measurement range of the displacement value measurement method according to a width dimension of the plurality of corrugated cardboard sheet pieces, allocating the divided measurement ranges to each of the plurality of corrugated cardboard sheet pieces, and determining a warped status of the corrugated cardboard sheet pieces for each of the plurality of corrugated cardboard sheet pieces on the basis of measurement values from the displacement value measurement method in the allocated measurement ranges.


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