The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2021

Filed:

Sep. 03, 2019
Applicant:

Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;

Inventor:

Hongcheng Yang, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01);
U.S. Cl.
CPC ...
A61N 5/1081 (2013.01); A61N 5/1075 (2013.01); A61N 5/1084 (2013.01); A61N 2005/1076 (2013.01);
Abstract

A method for calibrating an alignment device includes obtaining one or more projection images of a phantom having one or more surface indicators, the one or more surface indicators indicating a first coordinate system relating to the phantom, an origin of the first coordinate system overlapping with a calibration point of the phantom. The method further includes determining a difference between the first coordinate system and a second coordinate system based on the one or more projection images, the second coordinate system being relating to a medical system. The method further includes adjusting the phantom to an updated state according to the difference between the first coordinate system and the second coordinate system such that the first coordinate system overlaps with the second coordinate system. The method also includes adjusting an alignment device according to the one or more surface indicators in the updated state.


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