The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Mar. 31, 2016
Koninklijke Philips N.v., Eindhoven, NL;
William Shi, Wakefield, MA (US);
Ajay Anand, Fishkill, NY (US);
Sheng-Wen Huang, Ossining, NY (US);
Shriram Sethuraman, Woburn, MA (US);
Hua Xie, Cambridge, MA (US);
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
A medium of interest is interrogated according to ultrasound elastography imaging. A preliminary elasticity-spatial-map is formed. This map is calibrated against a reference elasticity-spatial-map that comprises an array () of different () elasticity values. The reference map is formed to be reflective of ultrasonic shear wave imaging of a reference medium. The reference medium is not, nor located at, the medium of interest, and may be homogeneous. Shear waves that are propagating in a medium are tracked by interrogating the medium. From tracking locations on opposite sides of an ablated-tissue border, propagation delay of a shear wave in the medium and of another shear wave are measured. The two shear waves result from respectively different pushes () that are separately issued. A processor decides, based on a function of the two delays, that the border crosses between the two locations. The calibrated map is dynamically updated and may include post-ablation border expansion () and time-annotated previous stages ().