The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2021

Filed:

Nov. 15, 2018
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Thomas Flohr, Uehlfeld, DE;

Bernhard Schmidt, Fuerth, DE;

Katharine Lynn Rowley Grant, Rochester, MN (US);

Assignee:

SIEMENS HEALTHCARE GMBH, Erlangen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); G06T 11/00 (2006.01); G06T 5/00 (2006.01); G06T 7/00 (2017.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4241 (2013.01); A61B 6/032 (2013.01); A61B 6/482 (2013.01); A61B 6/504 (2013.01); A61B 6/5294 (2013.01); A61B 6/544 (2013.01); G06T 5/002 (2013.01); G06T 7/0012 (2013.01); G06T 11/008 (2013.01); A61B 6/405 (2013.01); A61B 6/4042 (2013.01); A61B 6/463 (2013.01); A61B 6/466 (2013.01); A61B 6/481 (2013.01); A61B 6/488 (2013.01); G06T 2207/10116 (2013.01);
Abstract

A method is for controlling an x-ray imaging device, in particular a computed tomography device. The x-ray imaging device includes an x-ray source and a photon counting detector as an x-ray detector. The methods includes, for an image acquisition process of a patient: determining at least one input parameter relating to at least one of an attenuation property of the patient and a purpose of the image acquisition; at least one of determining or adapting at least one operation parameter of the x-ray detector, dependent upon the at least one input parameter determined; and performing the image acquisition using the at least one operation parameter determined or adapted.


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