The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Jan. 06, 2020
Valencell, Inc., Raleigh, NC (US);
Steven Francis LeBoeuf, Raleigh, NC (US);
Tushar Dilip Tank, Raleigh, NC (US);
William M. Richey, Durham, NC (US);
Michael Edward Aumer, Raleigh, NC (US);
Valencell, Inc., Raleigh, NC (US);
Abstract
A method of producing subject-specific metric statistics includes collecting physiological data and meta data from a subject via a sensor system. The sensor system includes at least one sensor element, at least one signal processor, and memory in communication with the at least one signal processor. The collected data is processed via the at least one signal processor to determine a plurality of metric features from the collected data. The plurality of metric features are processed using one or more data clustering techniques via the at least one signal processor to generate at least one subject-specific metric statistic and at least one sensor metric. The at least one subject-specific metric statistic and the at least one sensor metric may be displayed via a display associated with a client device.