The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Feb. 08, 2018
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Sumitomo Metal Mining Co., Ltd., Tokyo, JP;
Daisuke Horikawa, Toyota, JP;
Ryuta Sugiura, Toyohashi, JP;
Taira Aida, Niihama, JP;
Satoshi Kanada, Niihama, JP;
Daisuke Horikawa, Toyota, JP;
Ryuta Sugiura, Toyohashi, JP;
Taira Aida, Niihama, JP;
Satoshi Kanada, Niihama, JP;
TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota, JP;
SUMITOMO METAL MINING CO., LTD., Tokyo, JP;
Abstract
A positive electrode composite material for a lithium ion secondary battery that makes it possible to appropriately reduce the electric resistance in a positive electrode and to realize a high-performance lithium ion secondary battery. The positive electrode composite material to be used in the positive electrode of the lithium ion secondary battery includes a particulate positive electrode active material composed of a lithium composite oxide having a layered crystal structure including at least lithium, and a conductive oxide. Here, a particulate region where primary particles of the conductive oxide are aggregated, and a film-shaped region where the conductive oxide is formed in a film shape adhere to at least a part of the surface of the positive electrode active material. The average particle diameter based on cross-sectional TEM observation of primary particles in the particulate region is equal to or greater than 0.3 nm, and in cross-sectional TEM observation of the film-shaped region, no particles with a particle diameter equal to or greater than 0.3 nm are observed, and there are no voids equal to or greater than 2 nm.