The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Sep. 06, 2018
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Yoshito Kamaji, Tokyo, JP;

Masahiro Sumiya, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); H01J 37/32 (2006.01); G05B 23/02 (2006.01); H01L 21/67 (2006.01); H01L 21/311 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
H01J 37/32935 (2013.01); G05B 23/0283 (2013.01); H01L 21/31116 (2013.01); H01L 21/67069 (2013.01); H01L 21/67253 (2013.01); H01L 21/67288 (2013.01); G06N 20/00 (2019.01);
Abstract

A plasma processing apparatus including a state prediction apparatus that predicts an apparatus state of the plasma processing apparatus configured to include an apparatus data recording unit that records apparatus data output from the plasma processing apparatus during the processing of the sample, a physical environment measurement data recording unit that measures physical environment in the processing chamber and records apparatus physical environment data, data correction unit that extracts a temporal change component of the physical environment from a plurality of the apparatus physical environment data recorded in the physical environment measurement data recording unit and extracts the temporal change component of the physical environment from the apparatus data to remove the temporal change components, and an apparatus state prediction calculation unit that predicts the state of the plasma processing apparatus using the apparatus data from which the temporal change component of the physical environment is removed as input data.


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