The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
May. 15, 2017
Bayer Healthcare Llc, Whippany, NJ (US);
John Volkar, Valencia, PA (US);
Corey A. Kemper, Pittsburgh, PA (US);
BAYER HEALTHCARE LLC, Whippany, NJ (US);
Abstract
The present disclosure relates to automated systems and methods which assess the quality of radiology examinations and identify actionable changes to improve the quality of future exams. For each of a plurality of imaging studies, a study protocol and set of study metrics can be defined and the defined study protocol can be performed to generate data associated with the imaging study. A metrics assessment can be performed by applying at least a portion of the data associated with the result of the imaging study against the set of study metrics for the imaging study so as to generate a metrics score for the imaging study. The metrics scores can be stored in a score repository and analyzed so as to provide recommendations to improve the examination process.