The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Jun. 27, 2019
Meharpratap Singh, Bellevue, WA (US);
BO Han, Bothell, WA (US);
Gagandeep Singh, Seattle, WA (US);
0965688 BC LTD, Bellevue, WA (US);
Abstract
A survey analysis process is disclosed for extracting and organizing dynamic textual content to use as input to structural equation modeling (SEM) for survey analysis in order to understand how customer experiences driver customer decisions. The survey analysis process applies natural language processing (NLP) to understand customers' open-ended comments and segment customers based on the topics. By doing this, open-ended questions can be handled in SEM. The survey analysis process then builds a structural equation model to evaluate how customers' real feelings affect their loyalty, satisfaction score, etc., which are measured as closed-ended questions in the survey. In this way, the survey analysis process enables SEM to handle customers' actual feelings.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile