The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Nov. 15, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Masato Utsumi, Tokyo, JP;

Tohru Watanabe, Tokyo, JP;

Ikuo Shigemori, Tokyo, JP;

Hiroshi Iimura, Tokyo, JP;

Hiroaki Ogawa, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 30/02 (2012.01); G06Q 10/04 (2012.01); G06Q 50/06 (2012.01); H02J 3/00 (2006.01); G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
G06Q 30/0202 (2013.01); G06Q 10/04 (2013.01); G06Q 50/06 (2013.01); H02J 3/00 (2013.01); H02J 3/003 (2020.01);
Abstract

Provided is a prediction system for calculating a prediction value related to a prediction target to which prediction in an arbitrary period is adapted. The prediction system includes a storage device which records a plurality of data used to calculate the prediction value and a control device which includes a predetermined operation model and applies the plurality of data to the operation model to calculate the prediction value. The control device changes the operation model, on the basis of information of respective temporal attributes of the plurality of data.


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