The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Dec. 11, 2019
Applicant:

Beijing University of Technology, Beijing, CN;

Inventors:

Yanfeng Sun, Beijing, CN;

Fujiao Ju, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/44 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6234 (2013.01); G06K 9/44 (2013.01); G06K 9/6202 (2013.01); G06K 9/6268 (2013.01);
Abstract

A processing method for high-order tensor data, which can avoid that the vectorization process of the image observation sample set damage the internal structure of the data, simplify the large amount of redundant information in the high-order tensor data in the image observation sample set, and improve the image processing speed. In this processing method for high-order tensor data, the high-order tensor data are divided into three parts: the shared subspace component, the personality subspace component and the noise part; the shared subspace component and the personality subspace component respectively represent the high-order tensor data as a group of linear combination of the tensor base and the vector coefficient; the variational EM method is used to solve the base tensor and the vector coefficient; design a classifier to classify the test samples by comparing the edge distribution of samples.


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