The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Dec. 05, 2018
Applicant:

Sz Dji Osmo Technology Co., Ltd., Shenzhen, CN;

Inventors:

Yan Wang, Shenzhen, CN;

Bo Zang, Shenzhen, CN;

Chenyu Xiang, Shenzhen, CN;

Dicong Qiu, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/32 (2006.01); H04N 5/232 (2006.01); G01S 3/786 (2006.01); F16M 11/10 (2006.01); F16M 11/18 (2006.01); G03B 17/56 (2021.01); F16M 11/20 (2006.01); F16M 13/04 (2006.01); G06T 7/90 (2017.01); G06K 9/22 (2006.01);
U.S. Cl.
CPC ...
G06K 9/3233 (2013.01); F16M 11/10 (2013.01); F16M 11/18 (2013.01); F16M 11/2071 (2013.01); F16M 13/04 (2013.01); G01S 3/7865 (2013.01); G03B 17/563 (2013.01); G06K 9/228 (2013.01); G06K 9/3208 (2013.01); G06T 7/90 (2017.01); H04N 5/2328 (2013.01); H04N 5/23206 (2013.01); H04N 5/23216 (2013.01); H04N 5/23218 (2018.08); H04N 5/23254 (2013.01); H04N 5/23299 (2018.08); H04N 5/232127 (2018.08); H04N 5/232933 (2018.08); F16M 2200/041 (2013.01); F16M 2200/044 (2013.01);
Abstract

A method includes one or more processors of a payload releasably coupled to a carrier detecting a deviation of a target from an expected target position within an image captured by an image sensor of the payload, and generating one or more control signals for the carrier based at least in part on the detected deviation of the target. The one or more control signals cause the carrier to change a pose of the payload so as to reduce the detected deviation in a subsequent image captured by the image sensor.


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