The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Apr. 05, 2017
Applicant:
Splunk Inc., San Francisco, CA (US);
Inventors:
Jesse Miller, Piedmont, CA (US);
Jason Szeto, Belmont, CA (US);
Jose Solis, Mountain View, CA (US);
Jindrich Dinga, Los Altos, CA (US);
David Marquardt, San Francisco, CA (US);
Assignee:
Splunk Inc., San Francisco, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/335 (2019.01); G06F 16/31 (2019.01); G06F 16/338 (2019.01); G06F 16/34 (2019.01); G06F 16/35 (2019.01); G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 16/335 (2019.01); G06F 16/319 (2019.01); G06F 16/338 (2019.01); G06F 16/345 (2019.01); G06F 16/358 (2019.01); G06T 11/206 (2013.01); G06T 2200/24 (2013.01);
Abstract
Systems and methods are disclosed for sampling a set of data using inverted indexes in response to a user interaction with a user interface. Based on the user interaction with a displayed grouping of a summarization of a set of data, the system uses filter criteria corresponding to the grouping to review one or more inverted indexes and identify a sample of events for analysis. The system then accesses the sample of events and provides the results for display to a user.