The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Mar. 03, 2020
Hitachi, Ltd., Tokyo, JP;
Tsunehiko Baba, Tokyo, JP;
Kazuhide Aikoh, Tokyo, JP;
Toshihiko Kashiyama, Tokyo, JP;
Jumpei Okoshi, Tokyo, JP;
Nobukazu Kondo, Tokyo, JP;
Kentaro Kakui, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
An analysis management server stores a factory A catalog group including a plurality of catalogs in factory A, an application destination catalog including a plurality of catalogs in factory B, and an application source analysis data correspondence table associating columns between a target table of factory A and a defect factor analysis table. A CPU is configured to: identify an unconnected catalog for which a catalog of factory B having an identical correspondence does not exist among the plurality of catalogs of factory A included in the application source analysis data correspondence table; identify an unconnected correspondence, which is a correspondence of the unconnected catalog in the application source analysis data correspondence table, sensor data of factory B, and an identical path correspondence which is a correspondence of a catalog on a path including the unconnected catalog; and display information of the unconnected correspondence and the identical path correspondence.