The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Sep. 21, 2017
Applicant:
Omron Corporation, Kyoto, JP;
Inventors:
Shuichi Misumi, Kyoto, JP;
Tetsuji Yamato, Yokohama, JP;
Assignee:
OMRON Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/22 (2006.01); G06F 11/30 (2006.01); H04M 11/00 (2006.01); H04Q 9/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2273 (2013.01); G06F 11/22 (2013.01); G06F 11/2236 (2013.01); G06F 11/30 (2013.01); G06F 11/3003 (2013.01); H04M 11/00 (2013.01); H04Q 9/00 (2013.01);
Abstract
The present invention is provided with a sensor-side metadata acquiring unit that acquires sensor-side test metadata, an application-side metadata acquiring unit that acquires application-side test metadata, a matching unit that determines matching of acquired sensor-side test metadata and acquired application-side test metadata, and a dataflow control command instructing unit that transmits a dataflow control command instructing test data flow to an opening test application from a sensor or network adaptor specified by matched sensor-side test metadata and the application-side test metadata.